목록 Comparative study on the specimen thickness measurement using EELS and CBED methods Year 2020 Author Yoon-Uk Heo Journal Applied Microscopy Volume 50:8 Status of publication submitted Link https://doi.org/10.1186/s42649-020-00029-4 67회 연결 https://doi.org/10.1186/s42649-020-00029-4