”Effect of Al incorporation on the performance and reliability of p-type metal-oxide –semiconductor field effect transistors”

Year

2012

Author

Yoon-Uk Heo, Tae-Young Jang, Donghyup Kim, Jun Suk Chang, Manh Cuong Nguyen, Musarrat Hasan, Hoichang Yang, Jae Kyeong Jeong, Rino Choi, Changhwan Choi,

Volume

Thin Solid Films, 521, 2012

Page

119-122

Status of publication

submitted